Télécharger Monte Carlo Modeling for Electron Microscopy and Microanalysis de David C. Joy livre En ligne
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Auteur : David C. Joy
Catégorie : Livres anglais et étrangers,Professional & Technical,Engineering
Broché : * pages
Éditeur : *
Langue : Français, Anglais
This book describes how Monte Carlo modeling methods can be applied to Electron Microscopy and Microanalysis. Computer programs for two basic types of Monte carlo simulation are developed from physical models of the electron scattering process; a Single Scattering program capable of high accuracy but requiring long computation times, and a Plural Scattering program which is less accurate but much more rapid. The programs are optimised for use on personal computers and provide a real time graphical display of the interaction. These programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope including backscattering, secondary electron production, EBIC and cathodo- luminescence imaging, and X- ray microanalysis. The computer code is given in a fully annotated format so that it may be readily be modified for use in specific problems. Many examples of the applications of these methods are provided, together with a complete bibliography.
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Monte Carlo modeling for electron microscopy and microanalysis ~ Monte Carlo modeling for electron microscopy and microanalysis [electronic resource] / David C. Joy. Main author: Joy, David C., 1943-Corporate Author: Ebook Central Academic Complete., ProQuest (Firm) Format: eBook Online access: Connect to electronic book via Ebook Central.
Monte Carlo Modeling for Electron Microscopy and Microanalysis ~ Monte Carlo Modeling for Electron Microscopy and Microanalysis DAVID C. JOY New York Oxford OXFORD UNIVERSITY PRESS 1995. CONTENTS 1. An Introduction to Monte Carlo Methods 1.1. Electron Beam Interaction—The Problem 3 1.2. The Monte Carlo Method 4 1.3. Brief History of Monte Carlo Modeling 5 1.4. About This Book 7 2. Constructing a Simulation 9 2.1. Introduction 9 2.2. Describing the Problem .
Holdings: Monte Carlo Modeling for Electron Microscopy and ~ Monte Carlo Modeling for Electron Microscopy and Microanalysis. 1. Preface 2. An Introduction to Monte Carlo Methods 3. Constructing a Simulation 4. The Single Scattering Model 5. The Plural Scattering Model 6. Practical Applications of Monte Carlo Models 7. Backscattered Electrons 8. Charge Collection and Cathodoluminescence 9. Secondary .
Monte Carlo method in scanning electron microscopy. 1 ~ Results of modeling by the Monte Carlo method of signals from a scanning electron microscope examining rectangular grooves in silicon are compared with experimental results obtained for a scanning electron microscope operating in the secondary slow electron collection mode. The comparison is performed for the peaks of signals characterizing the primary electron beam near the walls of .
Monte Carlo Modeling for Electron Microscopy and ~ This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is .
Monte Carlo Modeling for Electron Microscopy and ~ Monte Carlo Modeling for Electron Microscopy and Microanalysis: Joy, David C.: 9780195088748: Books - Amazon.ca
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Monte Carlo Modeling for Electron Microscopy and ~ Monte Carlo Modeling for Electron Microscopy and Microanalysis (Inglés) Pasta dura – 13 abril 1995 por Oak Ridge National Laboratory Distinguished Scientist and Director Electron Microscope Facility David C Joy (Autor) Ver todos los formatos y ediciones Ocultar otros formatos y ediciones. Precio de Amazon Nuevo desde Usado desde Pasta dura "Vuelva a intentarlo" — $6,201.75 — Pasta dura .
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Monte Carlo Modeling for Electron Microscopy and ~ Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series in Optical & Imaging Sciences, Band 9) / David C. Joy / ISBN: 9780195088748 / Kostenloser Versand für alle Bücher mit Versand und Verkauf duch Amazon.
Monte Carlo Modeling for Electron Microscopy and Microanalysis ~ This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is .
Monte Carlo Modeling for Electron Microscopy and ~ Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series in Optical and Imaging Sciences) by David C. Joy (1995-04-13): David C. Joy: Books - Amazon.ca
Monte Carlo Method in Scanning Electron Microscopy. 2 ~ An analysis of the applicability of the Monte Carlo method for modeling images obtained in a scanning electron microscope is presented. It is shown that, in the Monte Carlo method, it is impossible to take into account all mechanisms of the interaction of electrons with matter that influence image formation. The amount of random numbers produced by modern random-number generators is .
Monte Carlo modeling for electron microscopy and ~ Title Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy. Author Joy, David C., 1943-ISBN 0195088743 (acid-free paper) Imprint New York : Oxford University Press, 1995. Language .
Monte Carlo Modeling for Electron Microscopy and ~ Monte Carlo Modeling for Electron Microscopy and Microanalysis By: D.C. Joy published: April, 1995: Amazon: D.C. Joy: Libros
CiNii 図書 - Monte Carlo modeling for electron microscopy ~ This book describes how Monte Carlo modeling methods can be applied to Electron Microscopy and Microanalysis. Computer programs for two basic types of Monte carlo simulation are developed from physical models of the electron scattering process; a Single Scattering program capable of high accuracy but requiring long computation times, and a Plural Scattering program which is less accurate but .
Monte-Carlo, Méthode de - BnF ~ Télécharger les données Le modèle de données SPARQL Endpoint Contact français english deutsch. Thèmes reliés; Documents sur; Auteurs liés; Voir aussi; Monte-Carlo, Méthode de Thème : Monte-Carlo, Méthode de: Origine : RAMEAU: Voir aussi : Geant4: Domaines : Mathématiques: Autres formes du thème : Échantillonnage stochastique Méthode de Monte-Carlo: Notices thématiques en .
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[ Monte Carlo Modeling for Electron Microscopy and ~ [ Monte Carlo Modeling for Electron Microscopy and Microanalysis[ MONTE CARLO MODELING FOR ELECTRON MICROSCOPY AND MICROANALYSIS ] By Joy, David C. ( Author )Apr-13-1995 Hardcover By Joy, David C. ( Author ) Hardcover 1995 ]: Joy, David C.: Books - Amazon.ca
Monte Carlo Modeling for Electron Microscopy and ~ This book describes how Monte Carlo modeling methods can be applied to Electron Microscopy and Microanalysis. Computer programs for two basic types of Monte carlo simulation are developed from physical models of the electron scattering process; a Single Scattering program capable of high accuracy but requiring long computation times, and a Plural Scattering program which is less accurate but .
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